Perkin Elmer Lambda 1050 UV-Vis-NIR Spectrometer: The UV-Vis-NIR instrument is one of our workhorses. The spectrometer has a spectral range from 195 nm (175 nm with nitrogen purging) to 3300 nm and spectral resolution of less than 0.1 nm. There are three detectors, InGaAs, PbSe, and a photomultiplier, for different spectral ranges. The lower limit for absorption is about 0.0001 A. We use the instrument for both solutions and thin film characterization.
Perkin Elmer FTIR Microscope: The IR spectrometer can be operated in a standard mode for either transmission or with an ATR accessory for evanescent mode spectra. Switching the excitation beam to the microscope allows imaging in the micron range by transmission, reflection, or ATR modes.
Horiba Fluorolog Spectrometer: The fluorescent instrument is our other workhorse. The spectrometer has a spectral range from 220 nm to 900 nm and spectral resolution of less than 0.5 nm. We use the instrument for both solutions and thin film characterization.
Agiltron Raman Spectrometer: The Raman spectrometer has a nominal resolution of 8 wavenumber and a spectral range from about 300 to 3000 wavenumbers. We use the instrument for Surface Enhanced Raman Spectroscopy (SERS) to detect molecules of interest on gold or silver coated surfaces.
Filmetrics Optical Profilometer: The profilometer is used to measure surface morphology in a noncontact manner.
Filmetrics Thin Film Analyzer: The thin film analyzer measures the reflectance spectrum of the sample and can be used to determine the thickness of coatings. Under ideal circumstances, the thickness of several layers can be determined concurrently.
Mettler-Toledo Cold Stage: The cold-stage provides a constant temperature to a stage for samples placed on microscope slides. This is coupled with an Ocean-Optics reflectance spectrometer to allow measurement of spectra as a function of temperatures below ambient.
Oriel Lamp: The lamp provides a bright white light.
TA Instruments Q100 Differential Scanning Calorimeter: The DSC provides thermal analysis from about –100 °C to over 600 °C. The instrument also has modulation capability to help determine glass transition temperatures and other kinetic events.
Malvern Zeta Sizer: This instrument uses light scattering to measure the zeta potential and size distribution of nanoparticles in solution.
Keithley Source Meter: This instrument measures current and voltage or provides a constant current source for electrochemical depositions.
Radiant Ferroelectric Tester: This instrument measures current and voltage using a Sawyer-Tower circuit to determine the electrical polarization of a sample. This is used to establish whether a substance is ferroelectric or not.
Laurell Technologies Spin-Coater: The spin-coater is used to form films of uniform thickness across a substrate surface. A solution of the substance to be coated is placed on the substrate and then the sample rotated at a high angular velocity. This drives the solvent off of the surface and the subsequent evaporation leaves behind a film of the solute.
MTI Dip-Coater: The dip-coater is also used to form films of uniform thickness across a substrate surface. A solution of the substance to be coated is placed in a beaker and the substrate is dipped into the solution and slowly withdrawn. By changing the withdrawal speed the thickness of the coating can be well controlled.
MTI Vacuum Oven: The vacuum oven is used in the temperature range of 300 °C and 1000 °C.
Analytical Balances: Both 4-place (left) and 5-place (right) analytical balances are used in the lab.
